Mitra, Souvick: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

1

3-D Integration and ESD Protection: Design and Analysis

Mitra, Souvick, Gebreselasie, Ephrem, Li, You, Gauthier, Robert, Tran-Quinn, Thuy, Ramachandran, Koushik

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2016

Language:

english

File:

PDF, 1.96 MB

english, 2016

2

[IEEE 2019 41st Annual EOS/ESD Symposium (EOS/ESD) - Riverside, CA, USA (2019.9.15-2019.9.20)] 2019 41st Annual EOS/ESD Symposium (EOS/ESD) - External Latchup Risks and Prevention Solutions in Advanced Bulk FinFET Technology

Liang, Wei, Gauthier, Robert, Mitra, Souvick, Lai, Hien

Year:

2019

Language:

english

File:

PDF, 2.33 MB

english, 2019

3

[IEEE 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hangzhou, China (2019.7.2-2019.7.5)] 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) - Study of Internal Latchup Behaviors in Advanced Bulk FinFET Technology

Liang, Wei, Gauthier, Robert, Mitra, Souvick, Li, You, Yan, Chen

Year:

2019

File:

PDF, 5.97 MB

2019

4

Degradation of High-$k$/Metal Gate nMOSFETs Under ESD-Like Stress in a 32-nm Technology

Yang, Yang, Gauthier, Robert J., Chatty, Kiran, Li, Junjun, Mishra, Rahul, Mitra, Souvick, Ioannou, Dimitris E.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2011

Language:

english

File:

PDF, 412 KB

english, 2011

5

[IEEE 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2015.9.27-2015.10.2)] 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - 3D integration ESD protection design and analysis

Mitra, Souvick, Gebreselasie, Ephrem, You Li,, Gauthier, Robert, Silberman, Joel, Tyberg, Christy, Sakuma, Katsuyuki, Thuy Tran-Quinn,, Ramachandran, Koushik, Angyal, Matthew

Year:

2015

Language:

english

File:

PDF, 493 KB

english, 2015

6

[IEEE 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV (2018.9.23-2018.9.28)] 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Comprehensive Study of ESD Design Window Scaling Down to 7nm Technology Node

Dong, Aihua, Xiong, Jie, Mitra, Souvick, Liang, Wei, Gauthier, Robert, Loiseau, Alain

Year:

2018

Language:

english

File:

PDF, 1.26 MB

english, 2018

7

Deep-level transient spectroscopy study on double implanted n[sup +]–p and p[sup +]–n 4H-SiC diodes

Journal:

Journal of Applied Physics

Year:

2004

Language:

english

File:

PDF, 345 KB

english, 2004

8

Transconductance frequency dispersion measurements on fully implanted 4H-SiC MESFETs

Souvick Mitra, Mulpuri V. Rao, Kenneth A. Jones

Journal:

Solid-State Electronics

Year:

2004

Language:

english

File:

PDF, 345 KB

english, 2004

9

[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Capacitance investigation of diodes and SCRs for ESD protection of high frequency circuits in sub-100nm bulk CMOS technologies

Li, Junjun, Gauthier, Robert, Chatty, Kiran, Mitra, Souvick, Hongmei Li,, Xingle Wang,, Halbach, Ralph, Seguin, Christopher

Year:

2007

Language:

english

File:

PDF, 491 KB

english, 2007

10

[IEEE 2007 IEEE International SOI Conference - Indian Wells, CA, USA (2007.10.1-2007.10.4)] 2007 IEEE International SOI Conference - NBTI and Concurrent HCI-NBTI Degradation of 65 nm SOI PMOSFETs

Mishra, Rahul, Mitra, Souvick, Gauthier, Robert, Ioannou, Dimitris E.

Year:

2007

Language:

english

File:

PDF, 526 KB

english, 2007

11

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Characterization of high-k/metal gate stack breakdown in the time scale of ESD events

Yang, Yang, Di Sarro, James, Gauthier, Robert J., Chatty, Kiran, Li, Junjun, Mishra, Rahul, Mitra, Souvick, Ioannou, Dimitris E.

Year:

2010

Language:

english

File:

PDF, 302 KB

english, 2010

12

Device physics considerations for SOI domino circuit design

Niraj Subba, Souvick Mitra, Akram Salman, Dimitris E Ioannou

Journal:

Solid-State Electronics

Year:

2003

Language:

english

File:

PDF, 133 KB

english, 2003

13

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - SOI Poly-defined Diode for ESD Protection in High Speed I/Os

Chen, Victor, Salman, Akram, Beebe, Stephen, Rosenbaum, Elyse, Mitra, Souvick, Putnam, Chris, Gauthier, Robert

Year:

2006

Language:

english

File:

PDF, 103 KB

english, 2006

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски